By Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel
Modern electronics rely on nanoscaled applied sciences that current new demanding situations by way of trying out and diagnostics. thoughts are quite vulnerable to defects for the reason that they make the most the expertise limits to get the top density. This ebook is a useful consultant to the trying out and diagnostics of the most recent new release of SRAM, essentially the most largely utilized different types of reminiscence. Classical tools for checking out reminiscence are designed to deal with the so-called "static faults," yet those try out recommendations aren't enough for faults which are rising within the most recent Very Deep Sub-Micron (VDSM) applied sciences. those new fault versions, often called "dynamic faults", are usually not lined by means of classical try strategies and require the devoted try out sequences provided during this book.
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Additional info for Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel